Proj
J-GLOBAL ID:200904061961687444  Research Project code:0450023443 Update date:Oct. 13, 2004

Development of High Precision Inspection System to Detect the Unevenness of Color on Liquid Crystal Film.

高精度な液晶色ムラ検査システムの開発
Study period:2004 - 2005
Organization (2):
Investigating Researcher (2):
Keywords (3):
Liquid Crystal Film ,  Unevenness ,  Inspection
Project Organization (1):
  • 浜松メトリックス株式会社(E446000000)
Researcher representative of the project  (1):
  • 上村宗市(総括研究代表)
Research program: -
Ministry with control over the research :
Ministry of Economy, Trade and Industry

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