Proj
J-GLOBAL ID:200904071410598748  Research Project code:9800024301 Update date:Mar. 17, 2006

Study on reliability test methods of electronic devices

電子デバイスの信頼性試験方法の研究 (相手国:韓国)
Study period:1993 - 1993
Organization (1):
Investigating Researcher (2):
Keywords (9):
electronic ,  reliability ,  degradation ,  lifetime ,  failure ,  computer ,  Japan ,  South ,  international
Research program: 0125 (Japanese Only)
Ministry with control over the research :
Ministry of Economy, Trade and Industry
Organization with control over the research:
国立研究開発法人産業技術総合研究所
Research budget: 1993: \2,279,000

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