Proj
J-GLOBAL ID:200904073133698945  Research Project code:9800004566 Update date:Feb. 27, 2003

Characterization of semiconductor surfaces and semiconductor heterojunctions by electron spectroscopy

電子分光法による半導体表面,半導体ヘテロ接合の評価
Study period:1987 - 0
Organization (1):
Investigating Researcher (2):
Research overview:
Characterization of semiconductor surfaces and heterojunctions by electron spectroscopy to establish a microscopic understanding on 1) atomic configurations at the growth front of semiconductors, 2) band structures at heterointerfaces, and 3) elementary excitations such as phonons and plasmons at semiconductor surfaces and interfaces.
Keywords (9):
electron ,  heterojunction ,  semiconductor ,  phonon ,  interface(surface) ,  plasmon ,  excitation(physics) ,  band ,  atomic
Research program: Ordinary Research
Research budget: 1994: \0

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