circuit test

電気工学
Related terms (6)：

test pattern (テストパターン)
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testability (可試験性)
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delay fault (遅延故障)
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Design For Testability (テスト容易化設計)
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test bench (テストベンチ)
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Broader terms (1)：

Narrower terms (7)：

built-in self-test (BIST)
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boundary scan (バウンダリスキャン)
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test structure (テスト構造)
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scan test (スキャンテスト)
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integrated circuit testing (集積回路試験)
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