critical dimension scanning electron microscope

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Synonyms (5)：

critical dimension scanning electron microscope (CD-SEM【顕微鏡】)
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CD-SEM(microscope) (CD-SEM【顕微鏡】)
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CD-SEM
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critical dimension scanning electron microscope (CD-SEM)
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critical dimension scanning electron microscope (測長SEM)
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Related terms (3)：

length measurement (長さ測定)
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measurement accuracy (測定精度)
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semiconductor process (半導体プロセス)
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Broader terms (1)：

scanning electron microscope (走査電子顕微鏡)
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