Mat
J-GLOBAL ID:200909007415048035   JST material number (FULL):K20030049O   JST material number:K20030049

2002 International Conference on Simulation of Semiconductor Processes and Devices

JST material number:
JST material number
Identifier of Material (journals)
K20030049
ISBN (1): 4-89114-027-5
Material type:Proceedings, Print, zz
Publication frequency: zz
Country of issued:Japan(JPN)
Language (1): English(EN)
JST classification  (2): 電子工学 (NC) ,  計算機利用技術 (JE)
Editor/ Editing house (4): Institute of Electrical and Electronics Engineers. Electron Devices Society ,  Institute of Electronics, Information and Communications Engineers ,  Institute of Electrical and Electronics Engineers. EDS Japan Chapter ,  Institute of Electrical and Electronics Engineers. EDS Kansai Chapter
Publisher: Japan Society of Applied Physics ,  Institute of Electrical and Electronics Engineers
Publication place:Tokyo
Conference name  (2):
  • International Conference on Simulation of Semiconductor Processes and Devices, Kobe, 20020904 - 20020906
  • SISPAD 2002
JST library information (0)

※Subject to change. Contact us for the latest status.


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