Mat
J-GLOBAL ID:200909013698533929   JST material number (FULL):K20070174J   JST material number:K20070174

Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics - 2004

JST material number:
JST material number
Identifier of Material (journals)
K20070174
ISBN (1): 1-55899-762-8
Series title  (1):
  • Materials Research Society Symposium Proceedings 812
Material type:Proceedings, Print, zz
Publication frequency: zz
Country of issued:United States(USA)
Language (1): English(EN)
Publisher: Materials Research Society
Publication place:Warrendale, Pa.
Conference name  (1):
  • Symposium on Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics, San Francisco, Calif., 20040413 - 20040415
JST library information (0)

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