Mat
J-GLOBAL ID：200909019494983974
JST material number (FULL)：K19860568F
JST material number：K19860568
Proceedings. IEEE 1985 Workshop on Simulation & Test Generation Environments
JST material number：
JST material number
Identifier of Material (journals)
K19860568
ISBN (1)：
0-8186-0732-7
Material type：Proceedings, Print, zz
Publication frequency： zz
Country of issued：United States(USA)
Language (1)：
English(EN)
Publisher：
Institute of Electrical and Electronics Engineers. Computer Society
Publication place：Washington
Conference name (1)：
- Workshop on Simulation & Test Generation Environments, San Francisco, Calif., 19850917 - 19850918
JST library information (0)：
Subject to change. Contact us for the latest status.
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