Mat
J-GLOBAL ID：200909024590913956
JST material number (FULL)：K19950780V
JST material number：K19950780
Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the 22nd State-of-the-Art Program on Compound Semiconductors (SOTAPOCS 22), 1995
JST material number：
JST material number
Identifier of Material (journals)
K19950780
ISBN (1)：
1-56677-100-5
Series title (1)：
- Proceedings. Electrochemical Society 95-6
Material type：Proceedings, Print, zz
Publication frequency： zz
Country of issued：United States(USA)
Language (1)：
English(EN)
Publisher：
Electrochemical Society
Publication place：Pennington, N.J.
Conference name (3)：
- Symposium on Nondestructive Wafer Characterization for Compound Semiconductors, Reno, Nev., 19950521 - 19950526
- State-of-the-Art Program on Compound Semiconductors, 22nd
- SOTAPOCS 22
JST library information (0)：
Subject to change. Contact us for the latest status.
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