Mat
J-GLOBAL ID：200909026256444115
JST material number (FULL)：K19910220U
JST material number：K19910220
1991 Proceedings. International Conference on Wafer Scale Integration
JST material number：
JST material number
Identifier of Material (journals)
K19910220
ISBN (1)：
0-8186-9126-3
Material type：Proceedings, Print, zz
Publication frequency： zz
Country of issued：United States(USA)
Language (1)：
English(EN)
Editor/ Editing house (1)：
Institute of Electrical and Electronics Engineers. Components, Hybrids, and Manufacturing Technology Society
Publisher：
Institute of Electrical and Electronics Engineers. Computer Society
Publication place：Los Alamitos, Calif.
Conference name (1)：
- International Conference on Wafer Scale Integration, San Francisco, Calif., 19910129 - 19910131
JST library information (0)
※：
※Subject to change. Contact us for the latest status.
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