Mat
J-GLOBAL ID：200909027431793795
JST material number (FULL)：W1320AAC
JST material number：W1320A
IEEE Transactions on Device and Materials Reliability
JST material number：
JST material number
Identifier of Material (journals)
W1320A
ISSN (1)：
1530-4388
CODEN (1)：
ITDMA2
Material type：Article, Meta Only, q
Publication frequency： q
Country of issued：United States(USA)
Language (1)：
English(EN)
JST classification (1)：
電子工学 (NC)
Publisher：
Institute of Electrical and Electronics Engineers
, Institute of Electrical and Electronics Engineers. Electron Devices Society
, Institute of Electrical and Electronics Engineers. Reliability Society
Publication place：New York
Conference name (2)：
- IEEE International Reliability Physics Symposium, Quebec, 20090426 - 20090430
- IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, 11th, Hsinchu, 20040705 - 20040708
JST library information (0)
※：
※Subject to change. Contact us for the latest status.
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