Mat
J-GLOBAL ID：200909033132385745
JST material number (FULL)：K19900180E
JST material number：K19900180
Defect and Fault Torerance in VLSI Systems, Vol.1
JST material number：
JST material number
Identifier of Material (journals)
K19900180
ISBN (1)：
0-306-43224-2
Material type：Proceedings, Print, zz
Publication frequency： zz
Country of issued：United States(USA)
Language (1)：
English(EN)
Editor/ Editing house (2)：
Institute of Electrical and Electronics Engineers. Computer Society
, Massachusetts Univ.
Publisher：
Plenum
Publication place：New York
Conference name (1)：
- International Workshop on Defect and Fault Tolerance in VLSI Systems, Springfield, Mass., 19881006 - 19881007
JST library information (0)：
Subject to change. Contact us for the latest status.
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