J-GLOBAL ID:200909033132385745   JST material number (FULL):K19900180E   JST material number:K19900180

Defect and Fault Torerance in VLSI Systems, Vol.1

JST material number:
JST material number
Identifier of Material (journals)
ISBN (1): 0-306-43224-2
Material type:Proceedings, Print, zz
Publication frequency: zz
Country of issued:United States(USA)
Language (1): English(EN)
Editor/ Editing house (2): Institute of Electrical and Electronics Engineers. Computer Society ,  Massachusetts Univ.
Publisher: Plenum
Publication place:New York
Conference name  (1):
  • International Workshop on Defect and Fault Tolerance in VLSI Systems, Springfield, Mass., 19881006 - 19881007
JST library information (0)

※Subject to change. Contact us for the latest status.

Return to Previous Page