Mat
J-GLOBAL ID:200909040828401504   JST material number (FULL):K19870040T   JST material number:K19870040

13th International Conference on Defects in Semiconductors, 1984

JST material number:
JST material number
Identifier of Material (journals)
K19870040
ISBN (1): 0-89520-485-1
Material type:Proceedings, Print, zz
Publication frequency: zz
Country of issued:United States(USA)
Language (1): English(EN)
Editor/ Editing house (9): American Telephone and Telegraph Co. Bell Lab. ,  General Electric Co. ,  Metallurgical Society of AIME ,  United States. National Aeronautics and Space Administration. Lewis Research Center ,  Rome Air Development Center. Solid State Science Div. ,  Solar Energy Research Inst. ,  United States. Army Research Office ,  United States. Defense Advanced Research Projects Agency ,  United States. Office of Naval Research
Publisher: Metallurgical Society
Publication place:Warrendale, Pa.
Conference name  (1):
  • International Conference on Defects in Semiconductors, 13th, Coronado, Calif., 19840812 - 19840817
JST library information (0)

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