Mat
J-GLOBAL ID：200909040877788147
JST material number (FULL)：E0318EAM
JST material number：E0318E
Micron
JST material number：
JST material number
Identifier of Material (journals)
E0318E
ISSN (1)：
0968-4328
Material type：Article, Meta Only, 12a
Publication frequency： 12a
Country of issued：Netherlands(NLD)
Language (1)：
English(EN)
JST classification (2)：
生物科学一般 (EA)
, 金属学 (WB)
Publisher：
Elsevier
Publication place：*
Conference name (3)：
- Workshop on Microanalytical Characterisation of Semi-conducting Materials and Devices, Lecce, 19981104 - 19981111
- International Workshop on Towards Atomic Resolution Analysis, Port Ludlow, Wash., 19980906 - 19980911
- Annual Meeting of the Microscopical Society of Canada, 24th, Edmonton, 19970604 - 19970607
Previous material name (2)：
- Micron and Microscopica Acta
- Electron Microscopy Reviews
JST library information (0)
※：
※Subject to change. Contact us for the latest status.
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