Mat
J-GLOBAL ID：200909045067094175
JST material number (FULL)：B0519BAV
JST material number：B0519B
IEEE Transactions on Pattern Analysis and Machine Intelligence
JST material number：
JST material number
Identifier of Material (journals)
B0519B
ISSN (1)：
0162-8828
CODEN (1)：
ITPIDJ
Material type：Article, Meta Only, m
Publication frequency： m
Country of issued：United States(USA)
Language (1)：
English(EN)
JST classification (1)：
計算機利用技術 (JE)
Publisher：
Institute of Electrical and Electronics Engineers. Computer Society
Publication place：Los Alamitos, Calif.
Conference name (1)：
- IEEE Conference on Computer Vision and Pattern Recognition, San Francisco, Calif., 20100613 - 20100618
JST library information (0)
※：
※Subject to change. Contact us for the latest status.
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