Mat
J-GLOBAL ID：200909054751020295
JST material number (FULL)：K19860620W
JST material number：K19860620
Microscopic Identification of Electronic Defects in Semiconductors
JST material number：
JST material number
Identifier of Material (journals)
K19860620
Series title (1)：
- Materials Research Society Symposia Proceedings 46
Material type：Proceedings, Print, zz
Publication frequency： zz
Country of issued：United States(USA)
Language (1)：
English(EN)
Publisher：
Materials Research Society
Publication place：Pittsburgh, Pa.
Conference name (1)：
- Symposium on Microscopic Identification of Electronic Defects in Semiconductors, San Francisco, Calif., 19850415 - 19850418
JST library information (0)
※：
※Subject to change. Contact us for the latest status.
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