Mat
J-GLOBAL ID：200909062919255539
JST material number (FULL)：K20000343E
JST material number：K20000343
1999 4th International Workshop on Statistical Metrology
JST material number：
JST material number
Identifier of Material (journals)
K20000343
ISBN (1)：
0-7803-5154-1
Material type：Proceedings, Print, zz
Publication frequency： zz
Country of issued：United States(USA)
Language (1)：
English(EN)
JST classification (1)：
電子工学 (NC)
Editor/ Editing house (5)：
Institute of Electrical and Electronics Engineers. Electron Devices Society
, VLSI Symposium
, 応用物理学会
, Institute of Electrical and Electronics Engineers. ED. Tokyo Chapter
, 電子情報通信学会
Publisher：
Institute of Electrical and Electronics Engineers
Publication place：Piscataway, N.J.
Conference name (2)：
- International Workshop on Statistical Metrology, 4th, Kyoto, 19990612 -
- 1999 IWSM
JST library information (0)：
Subject to change. Contact us for the latest status.
Return to Previous Page
