Mat
J-GLOBAL ID:200909062919255539
JST material number (FULL):K20000343E
JST material number:K20000343
1999 4th International Workshop on Statistical Metrology
JST material number:
JST material number
Identifier of Material (journals)
K20000343
ISBN (1):
0-7803-5154-1
Material type:Proceedings, Print, zz
Publication frequency: zz
Country of issued:United States(USA)
Language (1):
English(EN)
JST classification (1):
電子工学 (NC)
Editor/ Editing house (5):
Institute of Electrical and Electronics Engineers. Electron Devices Society
, VLSI Symposium
, 応用物理学会
, Institute of Electrical and Electronics Engineers. ED. Tokyo Chapter
, 電子情報通信学会
Publisher:
Institute of Electrical and Electronics Engineers
Publication place:Piscataway, N.J.
Conference name (2):
- International Workshop on Statistical Metrology, 4th, Kyoto, 19990612 -
- 1999 IWSM
JST library information (0):
Subject to change. Contact us for the latest status.
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