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J-GLOBAL ID:200909062919255539   JST material number (FULL):K20000343E   JST material number:K20000343

1999 4th International Workshop on Statistical Metrology

JST material number:
JST material number
Identifier of Material (journals)
K20000343
ISBN (1): 0-7803-5154-1
Material type:Proceedings, Print, zz
Publication frequency: zz
Country of issued:United States(USA)
Language (1): English(EN)
JST classification  (1): 電子工学 (NC)
Editor/ Editing house (5): Institute of Electrical and Electronics Engineers. Electron Devices Society ,  VLSI Symposium ,  応用物理学会 ,  Institute of Electrical and Electronics Engineers. ED. Tokyo Chapter ,  電子情報通信学会
Publisher: Institute of Electrical and Electronics Engineers
Publication place:Piscataway, N.J.
Conference name  (2):
  • International Workshop on Statistical Metrology, 4th, Kyoto, 19990612 -
  • 1999 IWSM
JST library information (0): Subject to change. Contact us for the latest status.

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