Mat
J-GLOBAL ID：200909064441775801
JST material number (FULL)：C0530ABN
JST material number：C0530A
Microelectronics Reliability
JST material number：
JST material number
Identifier of Material (journals)
C0530A
ISSN (1)：
0026-2714
Material type：Article, Meta Only, m
Publication frequency： m
Country of issued：United Kingdom(GBR)
Language (1)：
English(EN)
JST classification (2)：
電子工学 (NC)
, 生産工学 (KB)
Publisher：
Elsevier
Publication place：Kidlington
Conference name (65)：
- JEDEC Reliability of Compound Semiconductors Workshop, 27th, Boston, Mass., 20120423 -
- European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis, 23rd, Cagliari, 20121001 - 20121005
- International Conference on Materials for Advanced Technologies, Singapore, 20110626 - 20110701
- International Conference on Thermal, Mechanical and Multi-physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 12th, Linz, 20110418 - 20110420
- International Seminar on Power Semiconductors, 10th, Prague, 20100901 - 20100903
ｍore...
Previous material name (1)：
- Electronics Reliability & Microminiaturization
JST library information (0)
※：
※Subject to change. Contact us for the latest status.
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