Mat
J-GLOBAL ID：200909068920732241
JST material number (FULL)：C0406BAJ
JST material number：C0406B
Microelectronic Engineering
JST material number：
JST material number
Identifier of Material (journals)
C0406B
ISSN (1)：
0167-9317
CODEN (1)：
MIENEF
Material type：Article, Meta Only, 18a
Publication frequency： 18a
Country of issued：Netherlands(NLD)
Language (1)：
English(EN)
JST classification (1)：
電子工学 (NC)
Publisher：
Elsevier
Publication place：Amsterdam
Conference name (59)：
- European Conference on Electron and Optical Beam Testing of Integrated Circuits, 2nd, Duisburg, 19891001 - 19891004
- Micro and Nano Engineering Conference, 41st, Hague, 20150921 - 20150924
- MNE 2015, Hague, 20150921 - 20150924
- International Conference Micro& Nano, 6th, Glyfada, 20151004 - 20151007
- Micro and Nano Engineering Conference, 41st, Hague, 20150921 - 20150924
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JST library information (0)：
Subject to change. Contact us for the latest status.
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