Mat
J-GLOBAL ID:200909072084556198   JST material number (FULL):K19900792P   JST material number:K19900792

Proceedings of the Symposia on Reliability of Semiconductor Devices and Interconnection and Multilevel Metallization, Interconnection and Contact Technologies, 1988

JST material number:
JST material number
Identifier of Material (journals)
K19900792
Series title  (1):
  • Proceedings. Electrochemical Society 89-6
Material type:Proceedings, Print, zz
Publication frequency: zz
Country of issued:United States(USA)
Language (1): English(EN)
Editor/ Editing house (2): Electrochemical Society. Dielectrics and Insulation Div. ,  Electrochemical Society. Electronics Div.
Publisher: Electrochemical Society
Publication place:Pennington, N.J.
Conference name  (1):
  • Symposia on Reliability of Semiconductor Devices and Interconnection and Multilevel Metallization, Interconnection and Contact Technologies, Chicago, Ill., 19881009 - 19881014
JST library information (0)

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