Mat
J-GLOBAL ID：200909072084556198
JST material number (FULL)：K19900792P
JST material number：K19900792
Proceedings of the Symposia on Reliability of Semiconductor Devices and Interconnection and Multilevel Metallization, Interconnection and Contact Technologies, 1988
JST material number：
JST material number
Identifier of Material (journals)
K19900792
Series title (1)：
- Proceedings. Electrochemical Society 89-6
Material type：Proceedings, Print, zz
Publication frequency： zz
Country of issued：United States(USA)
Language (1)：
English(EN)
Editor/ Editing house (2)：
Electrochemical Society. Dielectrics and Insulation Div.
, Electrochemical Society. Electronics Div.
Publisher：
Electrochemical Society
Publication place：Pennington, N.J.
Conference name (1)：
- Symposia on Reliability of Semiconductor Devices and Interconnection and Multilevel Metallization, Interconnection and Contact Technologies, Chicago, Ill., 19881009 - 19881014
JST library information (0)：
Subject to change. Contact us for the latest status.
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