Mat
J-GLOBAL ID:200909072084556198
JST material number (FULL):K19900792P
JST material number:K19900792
Proceedings of the Symposia on Reliability of Semiconductor Devices and Interconnection and Multilevel Metallization, Interconnection and Contact Technologies, 1988
JST material number:
JST material number
Identifier of Material (journals)
K19900792
Series title (1):
- Proceedings. Electrochemical Society 89-6
Material type:Proceedings, Print, zz
Publication frequency: zz
Country of issued:United States(USA)
Language (1):
English(EN)
Editor/ Editing house (2):
Electrochemical Society. Dielectrics and Insulation Div.
, Electrochemical Society. Electronics Div.
Publisher:
Electrochemical Society
Publication place:Pennington, N.J.
Conference name (1):
- Symposia on Reliability of Semiconductor Devices and Interconnection and Multilevel Metallization, Interconnection and Contact Technologies, Chicago, Ill., 19881009 - 19881014
JST library information (0)
※:
※Subject to change. Contact us for the latest status.
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