Mat
J-GLOBAL ID：200909074622374073
JST material number (FULL)：K19820061J
JST material number：K19820061
Defects in Semiconductors
JST material number：
JST material number
Identifier of Material (journals)
K19820061
ISBN (1)：
0-444-00596-X
Series title (1)：
- Materials Research Society Symposia Proceedings 2
Material type：Proceedings, Print, zz
Publication frequency： zz
Country of issued：United States(USA)
Language (1)：
English(EN)
Editor/ Editing house (1)：
Materials Research Society
Publisher：
North-Holland
Publication place：New York
Conference name (1)：
- Symposium on Defects in Semiconductors, Boston, Mass., 19801116 - 19801120
JST library information (0)：
Subject to change. Contact us for the latest status.
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