Mat
J-GLOBAL ID：200909090292835708
JST material number (FULL)：K19920003A
JST material number：K19920003
Electron Microscopy 1990, Vol.3
JST material number：
JST material number
Identifier of Material (journals)
K19920003
Material type：Proceedings, Print, zz
Publication frequency： zz
Country of issued：United States(USA)
Language (1)：
English(EN)
Editor/ Editing house (1)：
International Federation of Societies for Electron Microscopy
Publisher：
San Francisco Press
Publication place：San Francisco, Calif.
Conference name (2)：
- International Congress for Electron Microscopy, 12th, Seattle, Wash., 19900812 - 19900818
- Annual Meeting of the Microbeam Analysis Society, 25th, Seattle, Wash., 19900801 -
JST library information (0)：
Subject to change. Contact us for the latest status.
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