Mat
J-GLOBAL ID：200909091702178358
JST material number (FULL)：K20030105T
JST material number：K20030105
2002 IEEE International Integrated Reliability Workshop Final Report
JST material number：
JST material number
Identifier of Material (journals)
K20030105
ISBN (1)：
0-7803-7558-0
Material type：Proceedings, Print, zz
Publication frequency： zz
Country of issued：United States(USA)
Language (1)：
English(EN)
JST classification (1)：
電子工学 (NC)
Publisher：
Institute of Electrical and Electronics Engineers. Electron Device Society
, Institute of Electrical and Electronics Engineers. Reliability Society
Publication place：*
Conference name (1)：
- IEEE International Integrated Reliability Workshop, Lake Tahoe, Calif., 20021021 - 20021024
JST library information (0)
※：
※Subject to change. Contact us for the latest status.
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