J-GLOBAL ID:200909091702178358   JST material number (FULL):K20030105T   JST material number:K20030105

2002 IEEE International Integrated Reliability Workshop Final Report

JST material number:
JST material number
Identifier of Material (journals)
ISBN (1): 0-7803-7558-0
Material type:Proceedings, Print, zz
Publication frequency: zz
Country of issued:United States(USA)
Language (1): English(EN)
JST classification  (1): 電子工学 (NC)
Publisher: Institute of Electrical and Electronics Engineers. Electron Device Society ,  Institute of Electrical and Electronics Engineers. Reliability Society
Publication place:*
Conference name  (1):
  • IEEE International Integrated Reliability Workshop, Lake Tahoe, Calif., 20021021 - 20021024
JST library information (0)

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