Mat
J-GLOBAL ID：200909092958534646
JST material number (FULL)：K19720090K
JST material number：K19720090
Proceedings International Conference on Radiation Damage and Defects in Semiconductors 720719
JST material number：
JST material number
Identifier of Material (journals)
K19720090
Material type：Proceedings, Print, zz
Publication frequency： zz
Country of issued：United Kingdom(GBR)
Language (1)：
English(EN)
Editor/ Editing house (3)：
International Union of Pure and Applied Physics
, United States. Air Force
, Whitehouse, J. K.
Publisher：
Institute of Physics
Publication place：London
Conference name (1)：
- International Conference on Radiation Damage and Defects in Semiconductors, Reading, Berks., 19720719 -
JST library information (0)：
Subject to change. Contact us for the latest status.
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