J-GLOBAL ID:200909093514686632   JST material number (FULL):K19920029U   JST material number:K19920029

Materials Reliability Issues in Microelectronics

JST material number:
JST material number
Identifier of Material (journals)
ISBN (1): 1-55899-119-0
Series title  (1):
  • Materials Research Society Symposia Proceedings 225
Material type:Proceedings, Print, zz
Publication frequency: zz
Country of issued:United States(USA)
Language (1): English(EN)
Publisher: Materials Research Society
Publication place:Pittsburgh, Pa.
Conference name  (1):
  • Symposium on Materials Reliability Issues in Microelectronics, 1st, Anaheim, Calif., 19910430 - 19910503
JST library information (0)

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