Mat
J-GLOBAL ID：200909093514686632
JST material number (FULL)：K19920029U
JST material number：K19920029
Materials Reliability Issues in Microelectronics
JST material number：
JST material number
Identifier of Material (journals)
K19920029
ISBN (1)：
1-55899-119-0
Series title (1)：
- Materials Research Society Symposia Proceedings 225
Material type：Proceedings, Print, zz
Publication frequency： zz
Country of issued：United States(USA)
Language (1)：
English(EN)
Publisher：
Materials Research Society
Publication place：Pittsburgh, Pa.
Conference name (1)：
- Symposium on Materials Reliability Issues in Microelectronics, 1st, Anaheim, Calif., 19910430 - 19910503
JST library information (0)：
Subject to change. Contact us for the latest status.
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