Mat
J-GLOBAL ID:200909093514686632
JST material number (FULL):K19920029U
JST material number:K19920029
Materials Reliability Issues in Microelectronics
JST material number:
JST material number
Identifier of Material (journals)
K19920029
ISBN (1):
1-55899-119-0
Series title (1):
- Materials Research Society Symposia Proceedings 225
Material type:Proceedings, Print, zz
Publication frequency: zz
Country of issued:United States(USA)
Language (1):
English(EN)
Publisher:
Materials Research Society
Publication place:Pittsburgh, Pa.
Conference name (1):
- Symposium on Materials Reliability Issues in Microelectronics, 1st, Anaheim, Calif., 19910430 - 19910503
JST library information (0):
Subject to change. Contact us for the latest status.
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