Rchr
J-GLOBAL ID:201001018241904119   Update date: Mar. 31, 2024

Ohtake Satoshi

オオタケ サトシ | Ohtake Satoshi
Affiliation and department:
Job title: Professor
Homepage URL  (1): https://gds.csis.oita-u.ac.jp/
Research field  (2): Computer systems ,  Electronic devices and equipment
Research keywords  (5): VLSI Design Technology ,  VLSI Test Technology ,  VLSI Design Automation (CAD) ,  Electronic Design Automation(EDA) ,  IoT Applications
Research theme for competitive and other funds  (20):
  • 2023 - 2026 Studies on instruction-level self-degradation detection mechanism and automated test program generation for processors
  • 2018 - 2024 Studies on Reliability Enhancement of Reconfigurable Integrated Circuits in the IoT Era
  • 2018 - 2023 Preventive safety for VLSIs Based on Adaptive Test during Field Operation
  • 2016 - 2019 Built-In Self Diagnosis for Functional Safety Assurance
  • 2015 - 2018 Reliability prediction using manufacturing test results of VLSIs
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Papers (73):
  • Shunsuke Mukai, Satoshi Ohtake. Vibration Measurement Experiment of Rails at Shinkansen Rail Yard in Kumamoto. GCCE. 2023. 318-320
  • Funakoshi Miyabi, Satoshi Ohtake. Hardware Implementation of Constant Monitoring System of Fetal Heart Sounds. ICCE-Taiwan. 2023. 663-664
  • Toshiyuki Haramaki, Satoshi Ohtake. A Method of Controlling Devices Remotely in Online Embedded System Engineer Training. ICCE-Taiwan. 2023. 495-496
  • Shunsuke Mukai, Satoshi Ohtake. Field Monitoring System for Frost Damage Warning and Quality Difference Analysis of Tea Leaves. ICCE-Taiwan. 2023. 139-140
  • Tsuneo Kagawa, Masaya Ikemoto, Satoshi Ohtake. A robust method of IC seating inspection in burn-in sockets using Hough transform. ICCE-TW. 2022. 1-2
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MISC (74):
  • 舩越 雅, 大竹 哲史. 胎児心音常時モニタリングシステムのハードウェア実装. 火の国情報シンポジウム2023. 2023. 1-6
  • 諸岡, 蓮, 賀川, 経夫, 大竹, 哲史. AR技術を用いた観光者向け地域情報提示ツールの開発. 第84回全国大会講演論文集. 2022. 2022. 1. 201-202
  • 岩本岬汰郎, 大竹哲史. SAT-based LFSR Seed Generation for Delay Fault BIST. 電子情報通信学会技術研究報告(Web). 2022. 121. 388(DC2021 64-78)
  • 諸岡, 蓮, 賀川, 経夫, 大竹, 哲史. ARランドマークを用いた観光案内支援ツールの開発. 第83回全国大会講演論文集. 2021. 2021. 1. 253-254
  • 岡龍之介, 大竹哲史, 熊木光一. Defective Chip Prediction Modeling Using Convolutional Neural Networks. 電子情報通信学会技術研究報告. 2020. 119. 420(DC2019 86-97)(Web)
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Patents (6):
  • Circuit diagnosis test device and circuit diagnosis test method
  • スキャンBISTのLFSRシード生成法及びそのプログラムを記憶する記憶媒体
  • Asynchronous memory element for scanning
  • スキャン非同期記憶素子およびそれを備えた半導体集積回路ならびにその設計方法およびテストパターン生成方法
  • 集積回路及びその集積回路の回路設計方法
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Education (3):
  • 1997 - 1999 Nara Institute of Science and Technology Graduate School of Information Science Doctoral Course
  • 1995 - 1997 Nara Institute of Science and Technology Graduate School of Information Science Master's Course
  • 1991 - 1995 The University of Electro-Communications Faculty of Electro-Communications Department of Computer Science
Professional career (1):
  • Doctor of Engineering (Nara Institute of Science and Technology)
Work history (11):
  • 2023/10 - 現在 Oita University
  • 2019/04 - 現在 Oita University Faculty of Science and Technology Professor
  • 2023/04 - 2023/09 Oita University Faculty of Science and Technology
  • 2022/04 - 2023/03 Oita University Faculty of Science and Technology
  • 2017/04 - 2019/03 Oita University Faculty of Science and Technology Associate Professor
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Committee career (10):
  • 2022/04 - 現在 大分県LSIクラスター形成推進会議 イノベーション部会 委員
  • 2015/04 - 現在 電子情報通信学会情報システムソサイエティ ディペンダブルシステム研究専門委員会 委員
  • 2011/01 - 現在 IEEE Workshop on RTL and High Level Testing Steering Committee Member
  • 2018/04 - 2022/03 情報処理学会 Transactions on System LSI Design Methodology 編集委員
  • 2015/04 - 2022/03 大分県LSIクラスター形成推進会議 グローバルイノベーション部会 委員
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Awards (5):
  • 2008/11 - IEEE Workshop on RTL and High Level Testing (WRTLT) 2007 Best Paper Award
  • 2006/11 - IEEE Workshop on RTL and High Level Testing (WRTLT) 2005 Best Paper Award
  • 2006/01 - IEEE International Workshop on Electronic Design, Test & Applications (DELTA) 2006 Best Paper Award
  • 2004/11 - IEEE Workshop on RTL and High Level Testing (WRTLT) 2003 Best Paper Award
  • 2002/09 - IEICE ISS 2001 Year Paper Award
Association Membership(s) (4):
IEEE Senior Member ,  情報処理学会 会員 ,  IEEE Computer Society Member ,  電子情報通信学会 会員
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