Rchr
J-GLOBAL ID:201001062659951481   Update date: Oct. 31, 2024

Kuroda Rihito

クロダ リヒト | Kuroda Rihito
Affiliation and department:
Job title: Professor
Homepage URL  (1): http://www.sgw.most.tohoku.ac.jp/
Research field  (2): Electric/electronic material engineering ,  Electronic devices and equipment
Research keywords  (2): Semiconductor integrated circuits ,  image sensor
Research theme for competitive and other funds  (8):
  • 2021 - 2026 作物の生理障害の機構解明におけるブレークスルーテクノロジーの開発と検証
  • 2019 - 2022 Construction of High-Sensitivity Real-Time Spectroscopic Imaging by Innovative High-Speed Spectroscopy and its Application to Non-Invasive Diagnostics
  • 2017 - 2020 Establishment of innovative small light amount difference image sensor with linear response 100 million electron full well capacity
  • 2015 - 2018 Establishment of a CMOS image sensor with photon countable sensitivity, linear response and high full well capacity
  • 2014 - 2016 Minimization of variation and noise of electrical characteristics of MOS transistors due to atomically flat gate insulator film/Si interface
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Papers (270):
  • Kyohei Tsutano, Takezo Mawaki, Yasuyuki Shirai, Rihito Kuroda. Evaluation of Metal Contamination Behavior on Silicon Wafer Surfaces Rinsed with Deionized Water Containing pg/L-Level Impurities. ECS Transactions. 2024. 114. 1. 27-33
  • Koga Saito, Tatsuhiko Suzuki, Hidemi Mitsuda, Tsubasa Nozaki, Takezo Mawaki, Rihito Kuroda. Impedance Measurement Platform for Statistical Capacitance and Current Characteristic Measurements of Arrayed Cells with Atto-order Precision. 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS). 2024. 1-6
  • Tetsu Oikawa, Rihito Kuroda, Aoi Hamaya, Yoshinobu Shiba, Takafumi Inada, Yushi Sakai, Yasuyuki Shirai, Shigetoshi Sugawa. [Invited Paper] A High SNR Global Shutter CMOS Image Sensor Technology for High Precision Absorption Imaging Applications. ITE Transactions on Media Technology and Applications. 2024. 12. 2. 167-174
  • Tsubasa Nozaki, Yoshiaki Watanabe, Chia-Chi Kuo, Koga Saito, Takezo Mawaki, Rihito Kuroda. A Preliminary Demonstration of High Resolution Proximity Capacitance-Optical Multimodal CMOS Image Sensor. Proceedings of the International Display Workshops. 2023. 1471-1471
  • Y. Sakai, Y. Shiba, T. Inada, T. Goto, T. Suwa, T. Oikawa, A. Hamaya, A. Sutoh, T. Morimoto, Y. Shirai, et al. Visualization and Analysis of Temporal and Steady-State Gas Concentration in Process Chamber Using 70-dB SNR 1,000 fps Absorption Imaging System. IEEE Transactions on Semiconductor Manufacturing. 2023. 1-1
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MISC (135):
  • 齊藤宏河, 鈴木達彦, 光田薫未, 間脇武蔵, 間脇武蔵, 諏訪智之, 寺本章伸, 寺本章伸, 須川成利, 黒田理人, et al. Statistical Measurement of Electrical Characteristics of Functional Thin Films Using Impedance Measurement Platform Technology. 応用物理学会秋季学術講演会講演予稿集(CD-ROM). 2023. 84th
  • 鈴木達彦, 齊藤宏河, 光田薫未, 間脇武蔵, 間脇武蔵, 須川成利, 黒田理人, 黒田理人. Statistical Measurement of Trap Characteristics of High Capacitance Density Trench Capacitor Using Current Measurement Platform. 応用物理学会秋季学術講演会講演予稿集(CD-ROM). 2023. 84th
  • 光田薫未, 鈴木達彦, 齊藤宏河, 間脇武蔵, 間脇武蔵, 須川成利, 黒田理人, 黒田理人. Statistical Measurement of HfOx Film Resistance Change Using Resistance Measurement Platform. 応用物理学会秋季学術講演会講演予稿集(CD-ROM). 2023. 84th
  • 間脇武蔵, 間脇武蔵, 黒田理人, 黒田理人. Statistical Analysis of Random Telegraph Noise Dependence on MOS Transistor Shapes and Drain-to-Source Voltage. 応用物理学会秋季学術講演会講演予稿集(CD-ROM). 2023. 84th
  • 間脇武蔵, 間脇武蔵, 黒田理人, 黒田理人. statistical analysis of random telegraphic noise dependence on operating condition using electrical characteristic measurement platform. 電子情報通信学会技術研究報告(Web). 2023. 123. 211(SDM2023 54-61)
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Patents (43):
Books (3):
  • 薄膜作製応用ハンドブック
    エヌ・ティー・エス 2020 ISBN:9784860436315
  • Rihito Kuroda and Shigetoshi Sugawa
    Springer International Publishing 2017 ISBN:9783319614915
  • 黒田 理人
    (株)技術情報協会 2017 ISBN:9784861046582
Lectures and oral presentations  (91):
  • A Global Shutter Wide Dynamic Range Soft X-ray CMOS Image Sensor with BSI Pinned Photodiode, Two-stage LOFIC and Voltage Domain Memory Bank
    (次世代画像ビジョンシステム部会定例会(第191回・オンライン) 2021)
  • A High SNR Wide Spectral Response CMOS Image Sensor Technology for Smart Sensing
    (4th International Symposium on Devices, Circuits and Systems 2021)
  • IEDM2020を振り返って
    (応用物理学会シリコンテクノロジー・電子情報通信学会シリコン材料・デバイス研究会, ULSIデバイス・プロセス技術(IEDM2020特集) 2021)
  • 超高速イメージセンサ、紫外域イメージセンサ技術
    (電子情報技術産業協会第4回「新機能イメージングデバイスおよび周辺技術分科会」 2020)
  • 半導体デバイスにおける欠陥評価 ~イメージセンサ・欠陥・プロセス~
    (第34回プラズマ新領域研究会「プラズマプロセスにおける欠陥生成に関する新生面」研究会 2020)
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Professional career (2):
  • 博士(工学) (Tohoku University)
  • 修士(工学) (Tohoku University)
Committee career (70):
  • 2021/06 - 現在 映像情報メディア学会東北支部 運営委員
  • 2020/07 - 現在 IEEE Transactions on Electron Devices Associate Editor
  • 2013/04 - 現在 映像情報メディア学会 情報センシング研究会 委員
  • 2020/04 - 2025/03 日本学術振興会 R025先進薄膜界面機能創成委員会 庶務幹事
  • 2021/12 - 2021/12 2021 IEEE International Electron Devices Meeting Courses Chair
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Awards (13):
  • 2021/03 - Activity Achievement Award
  • 2021/02 - Selection Committee of RIEC Award RIEC Award Tohoku University Researcher Development of Wide Spectral Sensitivity Image Sensor Technology and its High Precision Sensing Applications
  • 2020/05 - 19th Intelligent Cosmos Encouragement Award
  • 2020/02 - IS&T International Symposium on Electronic Imaging 2020, Imaging Sensors and Systems 2020 Arnaud Darmont Award for Best Paper
  • 2016/11/09 - International Selection Committee of 2016 nac High Speed Imaging Award The 2016 nac High Speed Imaging Award for their development of an Ultra High Speed CMOS Image Sensor with improved light sensitivity that is capable of capturing 20 million frames per second with a significant reduction in power consumption. This sensor is now commercially employed in the Shi
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Association Membership(s) (3):
The Institute of Electronics, Information and Communication Engineers ,  The Institute of Image Information and Television Engineers ,  IEEE Electron Device Society
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