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J-GLOBAL ID：201002023948153940   Reference number：78A0060437

A logic design structure for LSI testability.

LSIテスト可能性のための論理設計構造
Author (2)：
EICHELBERGER E B

About EICHELBERGER E B

, 
WILLIAMS T W

About WILLIAMS T W


Material：
Proc Des Autom Conf  (Proceedings of the Design Automation Workshop)

About Proc Des Autom Conf


Volume： 14th  Page： 462-468  Publication year： 1977 
JST Material Number： D0553A  ISSN： 0738-100X  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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LSI

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,...
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LSIテスト

About LSIテスト

, 
可能性

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, 
論理設計

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