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J-GLOBAL ID:201002284415045655   Reference number:10A1070865

THE ROLE OF DOPANTS IN SnO2-BASED SEMICONDUCTOR GAS SENSING MATERIALS (3)-CRYSTAL STRUCTURE ANALYSES USING X-RAY AND NEUTRON DIFFRACTION METHODS

半導体式ガスセンサに用いられるSnO2系センシング材料中のドーパントの役割(3)-X線回折法・中性子回折法による結晶構造解析
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Volume: 26  Issue: Supplement B  Page: 112-114  Publication year: Sep. 02, 2010 
JST Material Number: L3948A  CODEN: KAGSEU  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Measuring instruments in general  ,  Measurement,monitoring and instrumentation of chemical process  ,  Crystal growth of oxides 

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