Art

J-GLOBAL ID：201002290304657392   Reference number：10A1155836

Preparation and characterization of ultra-flat single crystal surfaces of Pd(111) and Au(111) by an in situ interference optical microscopy

その場干渉光学顕微鏡によるPd(111)及びAu(111)の超平坦単結晶表面の調製と特性化

Author (7)： WEN Rui (World Premier International Res. Center, Advanced Inst. for Materials Res. (WPI-AIMR), Tohoku Univ., JPN) ,  LAHIRI Abhishek (World Premier International Res. Center, Advanced Inst. for Materials Res. (WPI-AIMR), Tohoku Univ., JPN) ,  ALAGURAJAN Mukkannan (World Premier International Res. Center, Advanced Inst. for Materials Res. (WPI-AIMR), Tohoku Univ., JPN) ,  KUZUME Akiyoshi (World Premier International Res. Center, Advanced Inst. for Materials Res. (WPI-AIMR), Tohoku Univ., JPN) ,  KOBAYASHI Shin-ichiro (Dep. of Applied Chemistry, Graduate School of Engineering, Tohoku Univ., 6-6-04 Aoba, Sendai 980-8579, JPN) ,  ITAYA Kingo (World Premier International Res. Center, Advanced Inst. for Materials Res. (WPI-AIMR), Tohoku Univ., JPN) ,  ITAYA Kingo (Dep. of Applied Chemistry, Graduate School of Engineering, Tohoku Univ., 6-6-04 Aoba, Sendai 980-8579, JPN)
Material： Journal of Electroanalytical Chemistry  (J Electroanal Chem)
Volume： 649  Issue： 1-2  Page： 257-260  Publication year： Nov. 15, 2010 
JST Material Number： D0037A  ISSN： 1572-6657  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)

Thesaurus term： in situ observation ,  *interference microscope ,  optical microscope ,  single crystal ,  *palladium ,  *gold ,  atomic force microscope ,  scanning tunneling microscope ,  stepped shape ,  confocal laser scanning microscope ,  contrast ,  *electrochemical reaction ,  high-resolution ,  heat treatment
Semi thesaurus term： scanning tunneling microscope

JST classification (2)： Other phsical analysis  (CC03014E) ,  Electrode process  (CB07040U)

Terms in the title (8)： 干渉 ,  光学顕微鏡 ,  Pd ,  Au ,  平坦 ,  単結晶 ,  調製 ,  特性化