Art

J-GLOBAL ID：201102204188623888   Reference number：11A1703310

Origin of intrinsic dark count in superconducting nanowire single-photon detectors

超伝導ナノワイヤ単一光子検出器の固有暗計数の起源

Author (8)： YAMASHITA T. (Advanced ICT Res. Inst., National Inst. of Information and Communications Technol. (NICT), 588-2 Iwaoka, Kobe ...) ,  MIKI S. (Advanced ICT Res. Inst., National Inst. of Information and Communications Technol. (NICT), 588-2 Iwaoka, Kobe ...) ,  MAKISE K. (Advanced ICT Res. Inst., National Inst. of Information and Communications Technol. (NICT), 588-2 Iwaoka, Kobe ...) ,  QIU W. (Advanced ICT Res. Inst., National Inst. of Information and Communications Technol. (NICT), 588-2 Iwaoka, Kobe ...) ,  TERAI H. (Advanced ICT Res. Inst., National Inst. of Information and Communications Technol. (NICT), 588-2 Iwaoka, Kobe ...) ,  FUJIWARA M. (Advanced ICT Res. Inst., National Inst. of Information and Communications Technol. (NICT), 588-2 Iwaoka, Kobe ...) ,  SASAKI M. (Advanced ICT Res. Inst., National Inst. of Information and Communications Technol. (NICT), 588-2 Iwaoka, Kobe ...) ,  WANG Z. (Advanced ICT Res. Inst., National Inst. of Information and Communications Technol. (NICT), 588-2 Iwaoka, Kobe ...)
Material： Applied Physics Letters  (Appl Phys Lett)
Volume： 99  Issue： 16  Page： 161105  Publication year： Oct. 17, 2011 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Thesaurus term： nanowire ,  *photodetector ,  *counting rate ,  electric current ,  dependence ,  *vortex ,  fluctuation ,  *SSPD
Semi thesaurus term： bias current ,  *dark count rate ,  current dependence

JST classification (1)： Photometry and photodetectors in general  (BD07031F)

Terms in the title (6)： 伝導 ,  ナノワイヤ ,  単一光子検出器 ,  固有 ,  計数 ,  起源