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J-GLOBAL ID:201102213107930543   Reference number:11A0996249

中性子及び電子線照射後セラミックス試料の熱拡散率と陽電子寿命の相関

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Issue: 31  Page: ROMBUNNO.8  Publication year: 2010 
JST Material Number: L5681A  ISSN: 1349-7960  Document type: Article
Article type: 短報  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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