Art

J-GLOBAL ID：201102247010652818   Reference number：11A1898724

Development and evaluation of a microstep DFA vulnerability estimation method

マイクロステップDFA脆弱性推定の開発および評価

Author (3)： KAMINAGA Masahiro (Fac. of Engineering, Tohoku-Gakuin Univ.) ,  SHIKODA Arimitsu (Fac. of Engineering, Tohoku-Gakuin Univ.) ,  YOSHIKAWA Hideki (Fac. of Engineering, Tohoku-Gakuin Univ.)
Material： IEICE Electronics Express (Web)  (IEICE Electron Express (Web))
Volume： 8  Issue： 22  Page： 1899-1904 (J-STAGE)  Publication year： 2011 
JST Material Number： U0039A  ISSN： 1349-2543  Document type： Article
Article type： 短報  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： property ,  *failure analysis ,  *aggressive behavior ,  *secret key cryptosystem ,  *microcontroller ,  injection (pour) ,  *quantitative analysis (analytical chemistry) ,  public key cryptography ,  cryptogram ,  Computer Security ,  *sensitivity ,  block cipher ,  fault injection
Semi thesaurus term： DES cryptogram ,  差分故障解析 ,  vulnerability ,  quantitative evaluation

JST classification (2)： Data protection  (JD01020V) ,  Code theory  (ND02030R)

Reference (5)：

• [1] D. Boneh, R. DeMillo, and R. Lipton, “On the Importance of Checking Cryptographic Protocols for Faults,” EUROCRYPT'97, LNCS 1233, pp. 37-51, 1997.
• [2] E. Biham and A. Shamir, “Differential Fault Analysis of Secret Key Cryptosystems,” Proc. CRYPTO'97, LNCS 1294, pp. 513-525, 1997.
• [3] S. P. Skorobogatov and R. Anderson, “Optical Fault Induction Attacks,” Proc. CHES 2002, Springer LNCS 2523, pp. 2-12, 2003.
• [4] H. Choukri and M. Tunstall, “Round Reduction Using Faults,” Proc. FDTC, pp. 13-24, 2005.
• [5] J. Park, S. Moon, D. Choi, Y. Kang, and J. Ha, “Differential Fault Analysis for Round-Reduced AES by Fault Injection,” ETRI Journal, vol. 33, no. 3, pp. 434-442, 2011.

Terms in the title (5)： DFA ,  脆弱性 ,  推定 ,  開発 ,  評価