Observation of Field Emission Current Fluctuation with In Situ Analyzer of Field Emission Devices

GOTOH Yasuhito; KAWASAKI Michito; TSUJI Hiroshi

Art

J-GLOBAL ID：201102284714375529 Reference number：11A1179496

Observation of Field Emission Current Fluctuation with In Situ Analyzer of Field Emission Devices

電界放出素子のin situ解析装置による電界放出電流ゆらぎの観察

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Material：
Volume： 17th Issue： Vol.3 Page： 2041-2044 Publication year： 2010
JST Material Number： L4269A ISSN： 1883-2490 Document type： Proceedings
Article type：短報 Country of issue： Japan (JPN) Language： ENGLISH (EN)

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Display equipment , Thermoionic emission and field emission

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