J-GLOBAL ID:201110004038627720   Research Resource code:5000004348 Update date:Jan. 24, 2006

Scanning electron microscope

Owning Organization:
Contact: KUSABIRAKI Kiyoshi
Resource classification: Experience equipment, Facilities, etc
Research area  (4): Inorganic chemistry ,  Analytical chemistry ,  Applied physical properties/crystal engineering ,  Inorganic material/physical properties
This SEM is a good apparatus to observe the surface
topography of materials. The range of an accelerating
voltage is 0.5~30kV. A point resolution is 4.5nm.
This SEM has an unique function that is possible to
observe wettish materials.
User procedures and method:
[Procedure for Use] Make inquiries with a clerk in
[Qualification] Cooperative researchers with
researchers in Toyama University.

Return to Previous Page