J-GLOBAL ID:201110009009870600   Research Resource code:5000004351 Update date:Jan. 24, 2006

Materials surface analysis system

Owning Organization:
Contact: KUSABIRAKI Kiyoshi
Resource classification: Experience equipment, Facilities, etc
Research area  (4): Analytical chemistry ,  Thin film and surface interface physical properties ,  Electron/electric material engineering ,  Inorganic material/physical properties
This system is composed of two ultra-high vacuum
chambers. One is for vacuum deposition of thin films
and their non-destructive characterization such as
chemical composition and chemical bonding within a few
atomic layers from surfaces. Another one connected to
the growth chamber is for observation of surface
structure at an atomic level by scanning tunneling
microscope and atomic force microscope.
User procedures and method:
[Procedure for Use] Make inquiries with a clerk in
[Qualification] Cooperative researchers with
researchers in Toyama University.

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