Rsrc
J-GLOBAL ID:201110013744652176   Research Resource code:1000001890 Update date:Dec. 13, 2005

Soft X-ray XAFS

軟X線XAFS(放射光)
Owning Organization:
Contact: OKAMOTO Tokuhiko
Resource classification: Experience equipment, Facilities, etc
Research area  (2): Physical properties I ,  Thin film and surface interface physical properties
Overview:
The beamline consists of the pre-focusing
toroidal mirror, the double crystal monochromator
and the sample chamber and is for the measurement
of XAFS spectra in the photon energy range from
1keV to 3keV. The analysis of the spectra
provides information on the local atomic
arrangements ans the electronic states ofthe
atom whose Z number ranges from 11 to 20, if the
K absorption edge is used, andfrom 30 to 43, if
the L absorption edge is used.
User environment and conditions:
学内の教育・研究に支障のないこと。
User procedures and method:
利用手続き:別紙あり
利用料金:有料
利用者の資格:企業利用可

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