J-GLOBAL ID:201110021540020637   Research Resource code:1000000243 Update date:Jan. 27, 2005


Owning Organization:
Contact: NAGATA Akihiko, ISHIO Shunji, SATO Yuichi
Resource classification: Experience equipment, Facilities, etc
Research area  (1): Composite materials/physical properties
Cryogenic temperature experimental apparatus
Main purpose: Resolution of microscopic defects and
minute impurities in various materials by means of
measurements such as electric properties in a wide
range of temperature including cryogenic temperature,
of semiconductors, metallic thin films and ceramics,
precise measurement of superconducting materials,
measurement of fluorescent properties of
semiconductors or fluorescent materials.
(1) Superconducting materials measuring device
(2) Hall effect measuring device
(3) Liquid nitrogen production device
(4) Cryostat for photoluminescence measurement
(5) Electric properties measuring device
(6) Semiconductor parameter analyzer
(7) Electrode manufacturing device
Research field : Composed Materials and Properties
User environment and conditions:
Only if our research is not affected.
User procedures and method:
Procedure of use: For a detailed information of use,
contact our Center.
Charge: 1000 yen/month
Necessary qualification for use: Coworkers of the
Constraints on use: Nothing in particular.

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