Rsrc
J-GLOBAL ID:201110023190931278   Research Resource code:6000000062

極点図形測定装置

極点図形測定装置
Owning Organization:
Resource classification: 実験機器、施設等
Research area  (4): Applied physical properties/crystal engineering ,  Thin film and surface interface physical properties ,  Machine material/material mechanics ,  Electronic device/electronic equipment
Overview:
極点図形測定、X線回折測定によるセラミックス・金属等各種工業材料等の結晶方位・結晶構造等の解析

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