Research Resource code：1000001094
Update date：Sep. 21, 2004
Experience equipment, Facilities, etc
Research area (1)：
Thin film and surface interface physical properties
"Scanning probe microscope system SPI3800 (manufactured by
User environment and conditions：
Seiko Instruments Co. Ltd.)
This instrument is used mainly to measure surface microstructures."
Must not interrupt research activities.
User procedures and method：
"Procedure for use: Please contact a person in charge for details.
Return to Previous Page
Charge for use: Free except for expendable supplies to be prepared by users
Qualification for use: Persons who conduct cooperative research with
Faculty of System Engineering, Wakayama University, and who have participated in
an operational instruction course"