Rsrc
J-GLOBAL ID:201110023943485276   Research Resource code:1000001094 Update date:Sep. 21, 2004

走査型プローブ顕微鏡システム

走査型プローブ顕微鏡システム
Owning Organization:
Contact: TANAKA Ichiro
Resource classification: Experience equipment, Facilities, etc
Research area  (1): Thin film and surface interface physical properties
Overview:
"Scanning probe microscope system SPI3800 (manufactured by
Seiko Instruments Co. Ltd.)
This instrument is used mainly to measure surface microstructures."
User environment and conditions:
Must not interrupt research activities.
User procedures and method:
"Procedure for use: Please contact a person in charge for details.
Charge for use: Free except for expendable supplies to be prepared by users
Qualification for use: Persons who conduct cooperative research with
Faculty of System Engineering, Wakayama University, and who have participated in
an operational instruction course"

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