J-GLOBAL ID:201110026060150567   Research Resource code:5000003607 Update date:Nov. 19, 2005

Atomic Force Microscope

Owning Organization:
Contact: NAKAYAMA Takeyoshi
Resource classification: Experience equipment, Facilities, etc
Research area  (2): Electron/electric material engineering ,  Electronic device/electronic equipment
Atomic force microscope
Major purpose: Surface observation of various
device samples
User environment and conditions:
Should not hinder research affairs.
User procedures and method:
Procedures for use: For details, inquire of the
person in charge.
Use fee: Free
User's qualification: Collaborator of Kyushu
Restriction for use: Nothing in particular.

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