J-GLOBAL ID:201110031796404535   Research Resource code:1000001889 Update date:Dec. 13, 2005

Potoelectron spectroscopy (combined with ion scattering)

Owning Organization:
Contact: KIDO Yoshiaki, NANBA Hidetoshi
Resource classification: Experience equipment, Facilities, etc
Research area  (2): Physical properties I ,  Thin film and surface interface physical properties
Spectrometers for High Resolution Photoelectron
Spectroscopy and Medium Energy Ion Scattering
High resolution vacuum ultraviolat light and soft
X-ray from 5 to 700 eV can be used for high
resolution photoelectron spectroscopy (PES) for
solid surfaces. Atomic structures of surfaces are
simultaneously studied by high resolution medium
energy ion scattering joined with PES. New
surfaces can be designed by molecular beam
epitaxy in this apparatus.
The medium energy ion scattering using a new
toroidal electrostatic analyzer allows a
layer-by-layer analysis near a single crystal
surface. The probing depth is about 50 monolayers
(MLs)from a top surface. The energy and angular
spectra give the information about elemental
compositions.thermal vibration amplitudes and
atomic configurations for each atom layer.
User environment and conditions:
User procedures and method:

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