Rsrc
J-GLOBAL ID:201110031796404535   Research Resource code:1000001889 Update date:Dec. 13, 2005

Potoelectron spectroscopy (combined with ion scattering)

SORIS(光電子分光/イオン散乱分光)(放射光)
Owning Organization:
Contact: KIDO Yoshiaki, NANBA Hidetoshi
Resource classification: Experience equipment, Facilities, etc
Research area  (2): Physical properties I ,  Thin film and surface interface physical properties
Overview:
Spectrometers for High Resolution Photoelectron
Spectroscopy and Medium Energy Ion Scattering
(SORIS)
High resolution vacuum ultraviolat light and soft
X-ray from 5 to 700 eV can be used for high
resolution photoelectron spectroscopy (PES) for
solid surfaces. Atomic structures of surfaces are
simultaneously studied by high resolution medium
energy ion scattering joined with PES. New
surfaces can be designed by molecular beam
epitaxy in this apparatus.
The medium energy ion scattering using a new
toroidal electrostatic analyzer allows a
layer-by-layer analysis near a single crystal
surface. The probing depth is about 50 monolayers
(MLs)from a top surface. The energy and angular
spectra give the information about elemental
compositions.thermal vibration amplitudes and
atomic configurations for each atom layer.
User environment and conditions:
学内の教育・研究に支障のないこと。
User procedures and method:
利用手続き:別紙あり
利用料金:有料
利用者の資格:企業利用可

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