Rsrc
J-GLOBAL ID:201110039787331178   Research Resource code:1000000381 Update date:Nov. 10, 2004

LSI test system

LSI試験システム
Owning Organization:
Contact: Makoto IKEDA
Resource classification: Others
Research area  (1): Electronic device/electronic equipment
Overview:
Measurements of VLSI chip
User procedures and method:
Reservation through VDEC WWW page is necessary. The address is http://www.vdec.u-tokyo.ac.jp/.

Return to Previous Page