Rsrc
J-GLOBAL ID:201110041610559963   Research Resource code:5000002304 Update date:Dec. 07, 2005

X-ray residual stress analyzer

X線残留応力測定装置
Owning Organization:
Contact: SAKANE Hideto
Resource classification: Experience equipment, Facilities, etc
Research area  (4): Inorganic industrial material ,  Machine material/material mechanics ,  Structural/functional materials ,  Material processing/treatment
Overview:
It analyzes the residual stress of the surface region of
crystalline sample from the stress among crystal lattice
planes which distances are measured by X-ray diffraction
method.
Research field : 無機工業化学、構造・機能材料、材料加工・処理
User environment and conditions:
Each user should operate by oneself.
User procedures and method:
Procedure for use: After attending user guidance seminar
and registered, a booking should be made for every
useage.
Charge: Contact to the person in charge for details.
Qualification for use: Staff members and students of
University of Yamanashi.

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