Rsrc
J-GLOBAL ID:201110042015099610   Research Resource code:1000001886 Update date:Dec. 13, 2005

XAFS spectrometer

XAFS(X線吸収微細構造)(放射光)
Owning Organization:
Contact: OZUTSUMI Kazuhiko
Resource classification: Experience equipment, Facilities, etc
Research area  (2): Physical properties I ,  Applied physical properties/crystal engineering
Overview:
Characteristics of XAFS Spectrometer Monochromator:
Si(220) or Ge(220) Energy range:3.4-12.4 keV
Photon flux normalized to 300mA strage:4x* at
4 keV.3x* at 6 keV.6x*at 8 keV.6x* at 10 keV
(Beam size:2x9mm).
Energy Resolution estimeted from FWHM of rocking
curves:0.3 eV at 4 keV0.6 eV at7 keV.0.8 eV at
10 keV.
Experiment:transmission mode or fluorescent
detection under atmospheric pressure
User environment and conditions:
学内の教育・研究に支障のないこと。
User procedures and method:
利用手続き:別紙あり
利用料金:有料
利用者の資格:企業利用可

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