J-GLOBAL ID:201110045495190336   Research Resource code:0000000300 Update date:Aug. 21, 2009

Experimental Equipments

Owning Organization:
Contact: AKASAKA Miyuki
Resource classification: Experience equipment, Facilities, etc
Fast transient/burst tester
Oscillating wave tolerance tester
Power supply frequency field test facility
Temperature and humidity control system for electronic
device with low constant temperature
Extruder unit
FRP granulator
Compound materials cutter
Two liquids mixture discharger
X ray image analyzer
Impact test equipment for electronic devices
Support system for development of high speed digital
control system
Network spectrum analyze
Mixing performance test equipment
HDT tester for high temperature
Thunder surge tolerance tester
Support system for Highly integrated device development
Small radio anechoic chamber
X-ray photoelectron spectrometer
Auger electron spectrometer
Photo rapid prototyping system
Radio wave property measuring instrument
High speed media manufacturing equipment
Protocol analyzer
Analogue circuit simulator
User environment and conditions:
User should pay for office supplies of our apparatus.
User procedures and method:
Procedure for use: Fill special application form.
(you can download it from our HP)
Ask consultant of technological guide, faculty in
Technology Support center.

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