Rsrc
J-GLOBAL ID:201110048968484625   Research Resource code:1000001843 Update date:Dec. 01, 2005

Scanning Probe Microscopy System

走査型プローブ顕微鏡システム
Owning Organization:
Contact: HIGASHI Nobuyuki
Resource classification: Research resource, Research sample, Prototype, etc
Research area  (5): Physical chemistry ,  Organic chemistry ,  Inorganic chemistry ,  Synthetic chemistry ,  Polymer chemistry
Overview:
Scanning Probe Microscope: The system for observation
and analysis of sample surface with STM, AFM, and the
probe system for electrochemical measurement at the
molecular and atomic level
User environment and conditions:
Because measurement is conducted at the molecular and atomic level, the device is mounted on a platform for vibration suppression.
User procedures and method:
Contact the person in charge about the procedure for use,
as specified for this system.

Return to Previous Page