Rsrc
J-GLOBAL ID:201110049389991627   Research Resource code:5000004346 Update date:Jan. 24, 2006

Nanoscopic microscope Scanning tunneling microscope, atomic force microscope in atmosphere, inert gas or electrochemical solution.

三次元表面形状測定装置/大気、雰囲気中STM及びAFM、電気化学水溶液中STM及びAFM
Owning Organization:
Contact: KUSABIRAKI Kiyoshi
Resource classification: Experience equipment, Facilities, etc
Research area  (4): Analytical chemistry ,  Thin film and surface interface physical properties ,  Metallic physical properties ,  Inorganic material/physical properties
Overview:
Atomic scale surface morphology can be observed by
monitoring tunneling current or contact pressure
during a scan on surface of a sample by needle
electrode or cantilever.
User procedures and method:
[Procedure for Use] Make inquiries with a clerk in
charge.
[Qualification] Cooperative researchers with
researchers in Toyama University.

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