Rsrc
J-GLOBAL ID:201110051423156494   Research Resource code:5000003838 Update date:Nov. 01, 2005

High-tempeature Fatigue Testing Machine with Scanning Microscope

走査電子顕微鏡付高温疲労試験機
Owning Organization:
Contact: IZUI Hiroshi
Resource classification: Experience equipment, Facilities, etc
Research area  (1): Machine material/material mechanics

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