Rsrc
J-GLOBAL ID：201110051423156494
Research Resource code：5000003838
Update date：Nov. 01, 2005
High-tempeature Fatigue Testing Machine with Scanning Microscope
走査電子顕微鏡付高温疲労試験機
Owning Organization：
Contact：
IZUI Hiroshi
Resource classification：
Experience equipment, Facilities, etc
Research area (1)：
Machine material/material mechanics
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