Rsrc
J-GLOBAL ID:201110078499688814   Research Resource code:1000002197 Update date:Mar. 07, 2008

Field-emission type Scanning electron microscope equiped with X-ray micro-analyzer

X線分析装置付電界放射型走査電子顕微鏡
Owning Organization:
Contact: EZAKI Hisakazu
Resource classification: Others
Research area  (1): Metallic physical properties
Overview:
Field Emission Type Electron Microscope eqniped
with X-ray Micro Analyzer Outline :
High-resolution microstrncture observation and
Compositional analysis of varions materials
Resolutim :10nm Detective Elements :B-
User environment and conditions:
Users are expected not to disturb professors' study and teaching
User procedures and method:
Users are expected to co-study with professors,
and ask in details to apply for the device.

Return to Previous Page